Ind/13/02/2025
Asm 18/9/24
rst-Feb25
Dinar feb 2025
Dinar 22/01/2025
Validasi rst-Jan25rnAsm 06/09/24
Dinar 21/01.2025
Ance 26/08/24
rst 12/09/24rnThis thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researcher…